Megatech Ltd

Megatech Ltd is located in Cannock, United Kingdom on Littleton Dr, Huntington. Megatech Ltd is rated 1 out of 5 in the category semi conductor supplier in United Kingdom. Megatech Limited supply Equipment, Services, and Consumables for the Semiconductor and Thin Film industries. We provide the technology and services that enable our customers to achieve goals and solve problems. We offer a wide range of products, from our own cryopump brand MegaCold to other industry renowned brands that we distribute in the EU&UK as shown below. ---MegaCold: MegaCold cryopump is the most cost-effective addition to an existing vacuum system or as part of a vacuum pumping solution for new systems. The MegaCold can dramatically reduce pump down times and significantly improve product quality and throughput. Typically, 50-100% throughput improvements are achievable. ---Brooks Instrument: Flow meters and flow controllers by Brooks are a proven solution for flow measurement and flow control challenges. Brooks provides Coriolis mass flow, thermal mass flow, variable area flow meter, vacuum capacitance manometers, pressure control (pressure controllers, pressure gauges, pressure transmitters, pressure sensors and more), and level measurement technologies to improve your critical processes. ---Entegris: Entegris serves high technology markets by purifying, protecting and transporting critical materials used in manufacturing processes. These critical materials are often the very building blocks in producing many of the world's leading microelectronic products. ---Comdel: DC generators and matching networks are used by the leading semiconductor equipment manufacturers and IC makers throughout the world. ---Ferrotec: Ferrotec provides advanced technology solutions that make sealed rotating systems work better, more precisely, and more reliably. ---Verity: Verity Instruments is the leading supplier of optical endpoint detection systems to the Semiconductor Industry, providing integrated solutions for endpoint detection, film thickness measurement, wafer state interferometry, fault detection and plasma diagnostics.